units
ECE4064
Faculty of Engineering
This unit entry is for students who completed this unit in 2016 only. For students planning to study the unit, please refer to the unit indexes in the the current edition of the Handbook. If you have any queries contact the managing faculty for your course or area of study.
Refer to the specific census and withdrawal dates for the semester(s) in which this unit is offered.
Faculty
Organisational Unit
Department of Electrical and Computer Systems Engineering
Coordinator(s)
Dr Melanie Ooi (Malaysia)
Offered
Not offered in 2016
Electronic testing in IC fabrication cycle; the importance and organisation of testing within technological process; test equipment used in industry to verify the correct operation of digital integrated circuits (generic architecture and operation of a test system, main modules of a tester and their operation, computer-aided test engineering tools, test system programming, device interface board design), digital test methodologies (DC parametric, AC, functional and IDDQ tests), semiconductor memory testing, introduction to analog and mixed-signal testing, design-for-testability and built-in self-test and their implication on test technology, test data collection and analysis.
Upon successful completion of the unit, students are expected to:
Laboratory reports: 10%
Laboratory test and mid-semester test: 20%
Examination (3 hour): 70%
3 hours lectures, 1 hour tutorials, 2 hours laboratories and 6 hours private study per week
See also Unit timetable information
ECE2062 or ECE3062