Undergraduate - UnitECE4064 - Electronic test technology

This unit entry is for students who completed this unit in 2015 only. For students planning to study the unit, please refer to the unit indexes in the the current edition of the Handbook. If you have any queries contact the managing faculty for your course or area of study.

print version

6 points, SCA Band 2, 0.125 EFTSL

Refer to the specific census and withdrawal dates for the semester(s) in which this unit is offered.

Level	Undergraduate
Faculty	Faculty of Engineering
Organisational Unit	Department of Electrical and Computer Systems Engineering
Offered	Not offered in 2015
Coordinator(s)	Dr Melanie Ooi (Malaysia)

Synopsis

Electronic testing in IC fabrication cycle; the importance and organisation of testing within technological process; test equipment used in industry to verify the correct operation of digital integrated circuits (generic architecture and operation of a test system, main modules of a tester and their operation, computer-aided test engineering tools, test system programming, device interface board design), digital test methodologies (DC parametric, AC, functional and IDDQ tests), semiconductor memory testing, introduction to analog and mixed-signal testing, design-for-testability and built-in self-test and their implication on test technology, test data collection and analysis.

Outcomes

Upon successful completion of the unit, students are expected to:

develop and justify the requirements of different integrated circuit testing procedures such as parametric, functional, IDDQ, memory, design for test and built-in self test based on manufacturer's specifications and real-world production issues through thorough understanding of microelectronics evolution, fabrication and manufacturing processes, and the cost and roles of testing
evaluate and select the optimal test for printed circuit boards through a deep comprehension of ATE architecture and familiarity with real world test equipment.

Assessment

Laboratory reports: 10%
Laboratory test and mid-semester test: 20%
Examination (3 hour): 70%

Workload requirements

3 hours lectures, 1 hour tutorials, 2 hours laboratories and 6 hours private study per week

Chief examiner(s)

Professor Jamie Evans

Prerequisites

ECE2061 and ECE2072

Co-requisites

ECE2062 or ECE3062