units
ECE4064
Faculty of Engineering
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6 points, SCA Band 2, 0.125 EFTSLRefer to the specific census and withdrawal dates for the semester(s) in which this unit is offered.
SynopsisElectronic testing in IC fabrication cycle; the importance and organisation of testing within technological process; test equipment used in industry to verify the correct operation of digital integrated circuits (generic architecture and operation of a test system, main modules of a tester and their operation, computer-aided test engineering tools, test system programming, device interface board design), digital test methodologies (DC parametric, AC, functional and IDDQ tests), semiconductor memory testing, introduction to analog and mixed-signal testing, design-for-testability and built-in self-test and their implication on test technology, test data collection and analysis. Objectives
Upon successful completion of the unit, the students are expected:
Assessment
Laboratory reports: 10% Chief examiner(s)Contact hours3 hours lectures, 1 hour tutorials, 2 hours laboratories and 6 hours private study per week PrerequisitesCo-requisitesECE2062 or ECE3062 |