Offered
Sunway Second semester 2008 (Day)
Synopsis
Electronic testing in IC fabrication cycle; the importance and organisation of testing within technological process; test equipment used in industry to verify the correct operation of digital integrated circuits (generic architecture and operation of a test system, main modules of a tester and their operation, computer-aided test engineering tools, test system programming, device interface board design), digital test methodologies (DC parametric, AC, functional and IDDQ tests), semiconductor memory testing, introduction to analog and mixed-signal testing, design-for-testability and built-in self-test and their implication on test technology, test data collection and analysis.
Objectives
Upon successful completion of the unit, the students are expected:
- To gain appreciation of the microelectronics evolution, the IC fabrication process, the manufacture of microelectronic devices and the cost and roles of testing
- To know the different kinds of semiconductor testing and corresponding test types
- To be able to outline the requirements and procedures for DC parametric, AC parametric and Functional testing based on the device specifications sheets
- To get good appreciation of mixed-signal and memory testing, their specifics and alogrithms
- To be familiarised with IDDQ testing and be able to design and implement relevant test algorithms for a device in production.
- To know design-for-test and built-in self test methodologies
- To know ATE architecture and operation as well as to be able to design simple digital tests, program and implement them on real-world test equipment
- To obtain deep comprehension of functional and in-circuit testing of assembled printed circuit boards.
Assessment
Laboratory reports: 10%
Laboratory test and mid-semester test: 20%
Examination (3 hour): 70%
Contact hours
3 hours lectures, 1 hour tutorials, 2 hours laboratories and 6 hours private study per week
Prerequisites
ECE2071, ECE2072, ECE2061 and ECE2062
