Offered

Sunway Second semester 2008 (Day)

Synopsis

Electronic testing in IC fabrication cycle; the importance and organisation of testing within technological process; test equipment used in industry to verify the correct operation of digital integrated circuits (generic architecture and operation of a test system, main modules of a tester and their operation, computer-aided test engineering tools, test system programming, device interface board design), digital test methodologies (DC parametric, AC, functional and IDDQ tests), semiconductor memory testing, introduction to analog and mixed-signal testing, design-for-testability and built-in self-test and their implication on test technology, test data collection and analysis.

Objectives

Upon successful completion of the unit, the students are expected:

1. To gain appreciation of the microelectronics evolution, the IC fabrication process, the manufacture of microelectronic devices and the cost and roles of testing
2. To know the different kinds of semiconductor testing and corresponding test types
3. To be able to outline the requirements and procedures for DC parametric, AC parametric and Functional testing based on the device specifications sheets
4. To get good appreciation of mixed-signal and memory testing, their specifics and alogrithms
5. To be familiarised with IDDQ testing and be able to design and implement relevant test algorithms for a device in production.
6. To know design-for-test and built-in self test methodologies
7. To know ATE architecture and operation as well as to be able to design simple digital tests, program and implement them on real-world test equipment
8. To obtain deep comprehension of functional and in-circuit testing of assembled printed circuit boards.

Assessment

Laboratory reports: 10%
Laboratory test and mid-semester test: 20%
Examination (3 hour): 70%

Contact hours

3 hours lectures, 1 hour tutorials, 2 hours laboratories and 6 hours private study per week

Prerequisites

ECE2071, ECE2072, ECE2061 and ECE2062