Authorised by Academic Registrar, April 1996
Objectives The course will introduce students to transmission electron microscopy as an advanced technique in materials characterisation. It will also provide an introduction to the theory, capabilities and applications of a selection of other advanced techniques.
Synopsis Transmission electron microscopy: practical aspects of microscopy, amplitude and phase contrast imaging, kinematical theory of image contrast, electron diffraction. Analytical electron microscopy: X-ray spectroscopy, electron energy loss spectroscopy. Image analysis. Techniques of surface analysis. Nuclear magnetic resonance spectroscopy. Field ion microscopy (FIM) and atom probe FIM.