Authorised by Academic Registrar, April 1996
Objectives The course is intended to advance the student's knowledge of crystallography, defect structure and x-ray diffraction techniques, and thus to develop an understanding of the application of these ideas and techniques as a basis for interpreting the structure of materials.
Synopsis Crystallography: lattices; symmetry, stereographic projections; structure of crystals. Crystal defects: point, line and planar defects; vacancy formation; dislocation origins, motion and interactions; stacking faults, twins and grain boundaries. Diffraction techniques: production of x-rays; theory of diffraction; experimental applications in determining structural features of engineering materials; introduction to neutron and electron diffraction.