Undergraduate - UnitECE4064 - Electronic test technology

This unit entry is for students who completed this unit in 2012 only. For students planning to study the unit, please refer to the unit indexes in the the current edition of the Handbook. If you have any queries contact the managing faculty for your course or area of study.

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6 points, SCA Band 2, 0.125 EFTSL

Refer to the specific census and withdrawal dates for the semester(s) in which this unit is offered, or view unit timetables.

Level	Undergraduate
Faculty	Faculty of Engineering
Offered	Sunway Second semester 2012 (Day)
Coordinator(s)	Dr Melanie Ooi (Sunway)

Synopsis

Electronic testing in IC fabrication cycle; the importance and organisation of testing within technological process; test equipment used in industry to verify the correct operation of digital integrated circuits (generic architecture and operation of a test system, main modules of a tester and their operation, computer-aided test engineering tools, test system programming, device interface board design), digital test methodologies (DC parametric, AC, functional and IDDQ tests), semiconductor memory testing, introduction to analog and mixed-signal testing, design-for-testability and built-in self-test and their implication on test technology, test data collection and analysis.

Outcomes

Upon successful completion of the unit, the students are expected:

To gain appreciation of the microelectronics evolution, the IC fabrication process, the manufacture of microelectronic devices and the cost and roles of testing
To know the different kinds of semiconductor testing and corresponding test types
To be able to outline the requirements and procedures for DC parametric, AC parametric and Functional testing based on the device specifications sheets
To get good appreciation of mixed-signal and memory testing, their specifics and algorithms
To be familiarised with IDDQ testing and be able to design and implement relevant test algorithms for a device in production.
To know design-for-test and built-in self test methodologies
To know ATE architecture and operation as well as to be able to design simple digital tests, program and implement them on real-world test equipment
To obtain deep comprehension of functional and in-circuit testing of assembled printed circuit boards.

Assessment

Laboratory reports: 10%
Laboratory test and mid-semester test: 20%
Examination (3 hour): 70%

Chief examiner(s)

Professor Jamie Evans

Contact hours

3 hours lectures, 1 hour tutorials, 2 hours laboratories and 6 hours private study per week

Prerequisites

ECE2061 and ECE2072

Co-requisites

ECE2062 or ECE3062